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Scanning Electron Microscope (FE SEM)
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Scanning Electron Microscope (FE SEM)

 

Name of equipment:

Scanning Electron Microscope (FE SEM)

Use:

SEM allows researching the structures invisible to human eye by magnification up to 1,000,000 times.

Model, type, country of origin:

MIRA\\LMU, Tescan, Czech

 

 

Technical characte-ristics:

Resolution: 1.0 - 3.0 nm

Magnification: 4 x - 1.000.000 x

Electron gun: high brithness Schottky emitter

Scanning features: Dynamic Focus, Point & Line Scan, 3D Beam

Microscope control: PC controlled by the program MiraTC, using the WindowsTM platform

Automatic procedures: In-Flight Beam TracingTM, EasySEMTM, Wide Field OpticsTM

Year of origin:  2009.                  

Figure:

 

Method of
work:

Carefully prepared sample is placed in the chamber. Tightly focused electron beam falls on the surface of the sample from which high energy electrons are reflected and recorded by detectors. They simultaneously amplify the signal displayed as variations of brightness in the cathode ray tube.

Department,
room, location:

Department for Textile Chemistry and Ecology,

SEM Laboratory,

Savska cesta 16/9

Addition note:

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